Izumi T., Shiohara K., Machi T., Nakaoka K., Hirose H., Adachi K., Nakanishi T., Sato M., Aoki Y., Takahashi Y., Miura M., Hirai H., Konno M., Iwakuma M.
Awaji S., Izumi T., Kato T., Maiorov B., Miura M., Yoshida R., Nakaoka K., Kato Y., Harada T., Sekiya N., Maeda A., Sakuma K., Okada T., Nabeshima F., Tsuchiya G., Kurokawa H., Civale L.-8
Izumi T., Kato T., Hirayama T., Sato M., Miura M., Machi T., Ibi A., Nakaoka K., Yokoe D., Nishimura J.
Ключевые слова: HTS, YBCO, YSmBCO, YGdBCO, coated conductors, pinning arrays artificial, size effect, TFA-MOD process, critical caracteristics, critical current, composition, Jc/B curves, microstructure, angular dependence, critical current density, heat treatment, X-ray diffraction, fabrication, experimental results
Ключевые слова: HTS, YGdBCO, coated conductors, multistage process, TFA-MOD process, fabrication, doping effect, critical caracteristics, critical current density, current-voltage characteristics, pinning, comparison, EuBCO, PLD process, Jc/B curves, temperature dependence, angular dependence, experimental results
Ключевые слова: HTS, coated conductors, fabrication, substrate Hastelloy, buffer layers, planarization, MOD process, roughness, YBCO, PLD process, laminations
Ключевые слова: HTS, YGdBCO, nanoscaled effects, nanoparticles, doping effect, grain boundaries, angular dependence, buffer layers, critical caracteristics, TFA-MOD process, IBAD process, substrate Hastelloy, fabrication, critical current density, Jc/B curves, irreversibility fields, experimental results
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, fabrication, growth rate, thickness dependence
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, annealing process, mechanical properties, laminations, porosity, microstructure, fabrication, experimental results
Nakamura T., Kiss T., Izumi T., Shiohara Y., Kato T., Sakai N., Koizumi T., Taneda T., Ibi A., Nakaoka K., Yoshizumi M., Kimura K., Yoshida T., Takagi Y., Katayama T.M.
Ключевые слова: power equipment, cables, transformers, SMES, HTS, GdBCO, EuBCO, thickness dependence, critical caracteristics, critical current, laminations, ac losses, current distribution, long conductors, review
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, precursors, composition, critical current, heat treatment, fabrication
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, fabrication, high rate process, substrate Hastelloy, IBAD process
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, precursors, composition, microstructure, critical caracteristics, fabrication
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Miura M., Nakaoka K., Yoshizumi M., Fukushima H., Ichikawa Y.
Ключевые слова: HTS, coated conductors, TFA-MOD process, fabrication, YBCO, IBAD process, substrate Hastelloy, critical caracteristics, critical current, composition, Jc/B curves, critical current density, angular dependence, doping effect, heat treatment, current-voltage characteristics, experimental results, status
Izumi T., Shiohara Y., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T., Ichikawa H.
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Yoshida J.
Ключевые слова: HTS, YBCO, films, TFA-MOD process, substrate LaAlO3, fabrication, microstructure
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, high rate process, deposition setup, reel-to-reel process, fabrication
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Mukaida M., Miura M., Nakaoka K., Yoshizumi M., Yamada K., Mori N., Tada K., Yoshida J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, precursors, composition, critical caracteristics, critical current density, microstructure, fabrication
Teranishi R., Izumi T., Shiohara Y., Mukaida M., Miura M., Nakaoka K., Yamada K., Mori N., Mitani A.
Ключевые слова: HTS, YBCO, films, TFA-MOD process, fabrication, substrate LaAlO3, growth rate, critical current density, critical caracteristics, microstructure
Awaji S., Watanabe K., Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Mukaida M., Nakaoka K., Yoshizumi M., Yamada K., Mori N., Miyanaga Y., Nanba M.
Izumi T., Ito T., Takahashi Y., Yamada Y., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Ichikawa H., HiranoH., Tobita H., Y.Shiohara
Ключевые слова: presentation, HTS, YBCO, coated conductors, TFA-MOD process, fabrication, precursors, high rate process, critical current density
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Mitani A., Hisatsune Y.
Ключевые слова: HTS, REBCO, films, TFA-MOD process, substrate LaAlO3, grain alignment, fabrication
Ключевые слова: HTS, coated conductors, YBCO, composition, TFA-MOD process, fabrication, precursors, microstructure, critical current, critical caracteristics, substrate Hastelloy
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, fabrication, microstructure, heat treatment
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, growth rate, microstructure, fabrication
Izumi T., Shiohara Y., Mimura M., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T., Ichikawa H.
Iijima Y., Saitoh T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Matsuda J., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T.
Ключевые слова: HTS, coated conductors, buffer layers, PLD process, YBCO, TFA-MOD process, IBAD process, surface, nanoscaled roughness, fabrication
Goto T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Yajima A., Yoshinaka A., Miura M., Nakaoka K., Yoshizumi M.
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Mitani A.
Ключевые слова: HTS, REBCO, films, TFA-MOD process, substrate LaAlO3, microstructure, fabrication
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Tanaka T., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Tada K., Yoshida J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, microstructure, fabrication
Kiss T., Teranishi R., Izumi T., Shiohara Y., Inoue M., Matsuda J., Mukaida M., Nakaoka K., Yamada K., Mori N., Tada K., Yoshida J.
Ключевые слова: HTS, YBCO, films, substrate LaAlO3, TFA-MOD process, fabrication, critical current density, composition, microstructure, critical caracteristics
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miura M., Nakaoka K., Ichikawa H., H.Hirano, T.Ito, Y.Takahashi, H.Tobita, M.Yoshizumi
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, critical current density, fabrication
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, precursors, composition, critical current, Jc/B curves, growth rate, fabrication, presentation, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, microstructure, fabrication
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, fabrication, humidity, microstructure, critical current, critical current density, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, high rate process, fabrication, critical current, thickness dependence, critical caracteristics
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J.S., Nakaoka K., Kitoh Y., Yoshizumi M., Nalkanishi T.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, review, critical current, thickness dependence, composition, homogeneity, humidity, fabrication, critical caracteristics
Saitoh T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Yoshizumi M., Suzuki K., Nakai A., Nakanishi T.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, long conductors, critical current, thickness dependence, composition, Jc/B curves, review, fabrication, critical caracteristics, review
Goto T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Yoshizumi M., Nakanishi T.
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Yajima A., Machi T., Nakaoka K., Kitoh Y., Yoshizumi M., Suzuki K., Nakai A., Nakanishi T.
Ключевые слова: HTS, YBCO, REBCO, coated conductors, composition, Jc/B curves, TFA-MOD process, pinning centers, IBAD process, fabrication, critical caracteristics
Saitoh T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Matsuda J., Nakaoka K., Kitoh Y., Yoshizumi M., Nakai A., Nakanishi T.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, microstructure, fabrication, nucleation
Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Teranishi R.(teranishi@istec.or.jp), Nakaoka K., Kitoh Y., Nomoto S., Suzuki K.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, review, fabrication
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Machi T., Nakaoka K., Kitoh Y., Yoshizumi M., Suzuki K., Nakai A., Nakanishi T.
Ключевые слова: HTS, coated conductors, YBCO, YBCO, IBAD process, PLD process, TFA-MOD process, Jc/B curves, fabrication, critical caracteristics
Teranishi R., Fuji H., Aoki Y., Izumi T.(izumi@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Nomoto S.
Ключевые слова: HTS, coated conductors, TFA-MOD process, long conductors, review, YBCO, critical current, thickness dependence, Jc/B curves, fabrication, critical caracteristics
Teranishi R., Fuji H., Izumi T., Shiohara Y., Miyata S., Nakaoka K., Kitoh Y., Aoki Y.(y-aoki@istec.or.jp), Nomoto S., Matuda J.
Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Yajima A., Matsuda J.S., Koyama S., Nakaoka K.
Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Nakaoka K., Kitoh Y., Aoki Y.(y-aoki@istec.or.jp), Koyama T., Matuda J.S.
Ключевые слова: HTS, YBCO, coated conductors, reel-to-reel process, TFA-MOD process, current distribution, fabrication
Goto T., Teranishi R., Fuji H., Kaneko A., Murata K., Aoki Y., Yajima A., Yoshinaka A., Nakaoka K., Matsuda J.(jmatsuda@istec.or.jp)
Ключевые слова: HTS, YBCO, YBCO, coated conductors, TFA-MOD process, substrate SrTiO3, Jc/B curves, fabrication, critical caracteristics
Teranishi R., Tokunaga Y., Fuji H., Izumi T., Shiohara Y., Watanabe T., Yamada Y., Matsuda J.S., Koyama S., Nakaoka K.
Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Teranishi R.(teranishi@istec.or.jp), Nakaoka K., Kitoh Y., Nomoto S.
Saitoh T., Teranishi R., Izumi T., Shiohara Y., Fuji H.(hfuji@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kito Y.
Iijima Y., Goto T., Saitoh T., Teranishi R., Fuji H., Izumi T., Shiohara Y., Aoki Y., Yamada Y., Matsuda J., Yajima A., Yoshinaka A., Nakaoka K., Kitoh Y.
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.